Quantes Xps Haxpes Surface Analysis Instrument The phi genesis is the latest generation of phi’s highly successful multi technique xps product line with phi’s patented, monochromatic, micro focused, scanning x ray source. it is an easy to use, fully automated system with auto tuning and calibration and multiple parking positions for high throughput. the fully integrated multi technique. The phi quantes is the only automated, high throughput lab based haxpes spectrometer on the market. it is a unique scanning x ray photoelectron microprobe that combines a high energy (haxpes) monochromatic x ray source (chromium kα) with a conventional monochromatic soft x ray source (aluminum kα). both sources are high flux focused x ray.
Phi Quantes Xps Haxpes Surface Analysis Instrument Physical electronics (phi) is the leading supplier of aes, xps, tof sims, and d sims surface analysis instruments and equipment. X ray photoelectron spectroscopy xps. phi genesis; phi quantes; auger electron spectroscopy aes, sam. phi 710; time of flight sims tof sims. phi nanotof 3 dynamic sims d sims. phi adept 1010™ other products. The phi quantes is equipped with a dual scanning x ray source composed of a hard x ray source (cr kα) and a conventional soft x ray source (al kα), which have different energy values. this state of the art xps instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. The phi quantes is equipped with a dual scanning x ray source composed of a hard x ray source (cr kα) and a conventional soft x ray source (al kα), which have different energy values. this state of the art xps instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface.
Phi Quantes Xps Haxpes Surface Analysis Instrument The phi quantes is equipped with a dual scanning x ray source composed of a hard x ray source (cr kα) and a conventional soft x ray source (al kα), which have different energy values. this state of the art xps instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. The phi quantes is equipped with a dual scanning x ray source composed of a hard x ray source (cr kα) and a conventional soft x ray source (al kα), which have different energy values. this state of the art xps instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. Phi surface analysis equipment quantes introducing the new phi quantes: xps haxpes scanning microprobe. the quantes is a laboratory based. With phi genesis, ulvac phi has integrated its highly successful xps systems into one platform. xps & haxpes – surface analysis with two different excitation sources: xps has an information depth of approx. 5nm. the key technology in all phi systems is the scanning x ray source. it enables xps analysis with very small beam diameters and at.
Phi Quantes Xps Haxpes Surface Analysis Instrument Phi surface analysis equipment quantes introducing the new phi quantes: xps haxpes scanning microprobe. the quantes is a laboratory based. With phi genesis, ulvac phi has integrated its highly successful xps systems into one platform. xps & haxpes – surface analysis with two different excitation sources: xps has an information depth of approx. 5nm. the key technology in all phi systems is the scanning x ray source. it enables xps analysis with very small beam diameters and at.
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